Paper
10 September 1987 The Use Of Markov Random Field Models In Sampling Scheme Design
S. P. Luttrell
Author Affiliations +
Proceedings Volume 0808, Inverse Problems in Optics; (1987) https://doi.org/10.1117/12.941481
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
I use information theoretic techniques to derive schemes for the Bayesian analysis of images with spatially homogeneous statistical properties. In any particular case the scheme is equivalent to deducing the structure of the Markov random field which models the data. This scheme may also be viewed as a generalised sampling technique where the data is reduced by a set of sampling functions to a more compact set of data, which nevertheless retains all the information content of the original data.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. P. Luttrell "The Use Of Markov Random Field Models In Sampling Scheme Design", Proc. SPIE 0808, Inverse Problems in Optics, (10 September 1987); https://doi.org/10.1117/12.941481
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Cited by 2 scholarly publications.
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KEYWORDS
Magnetorheological finishing

Inverse problems

Statistical analysis

Data processing

Monte Carlo methods

Data modeling

Inverse optics

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