Automated Optical Testing

H. J. Tiziani

doi:10.1117/12.967293

1 January 1987 Automated Optical Testing

H. J. Tiziani

Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967293
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada

Abstract

Interferometry, holographic interferometry and speckle techniques are becoming useful tools for precision measurements in research and for industrial applications. Computer analysis ist increasingly important for the fringe analysis. The use of solid state detector-arrays, image memory boards together with microprocessors and computers for the extraction of the information from the interferograms and high resolution graphic boards find important application in optical metrology. Much more information can be extracted from the interferograms leading to higher sensitivities and accuracies.

Citation Download Citation

H. J. Tiziani "Automated Optical Testing", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967293

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