Research of the effects of TEC on UFPA noise performance

Qiao Jiang; Guangzhong Xie; Lixia Xiong; Baobin Liao; Longcheng Que; Yun Zhou; Jian Lv

doi:10.1117/12.974301

15 October 2012 Research of the effects of TEC on UFPA noise performance

Qiao Jiang, Guangzhong Xie, Lixia Xiong, Baobin Liao, Longcheng Que, Yun Zhou, Jian Lv

Proceedings Volume 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy; 841923 (2012) https://doi.org/10.1117/12.974301
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Infrared detection technology plays a more and more important role in military and business. Uncooled infrared focal plane array (UFPA) is a kind of thermal detector, which detects the infrared radiation of target through the microbolometer’s photoelectric conversion. Based on the thermal model of UFPA, stable and accordant substrate temperature of microbolometer array is extreme important to improve the UFPA’s noise performance. After researching the effects of substrate temperature act on UFPA’s noise performance and responsivity, a low noise data capture system with TEC controller for UFPA is designed. And a 320x240 microbolometer array’s noise is tested with this system. With the TEC controller, the substrate temperature fluctuates at a margin of only 0.006 ºC. The test result shows that a 12.1% decrease in RMS noise, a 14.5% decrease in FPN noise and improvement of responsivity non-uniformity over time have been obtained after using TEC controller in UFPA.

Citation Download Citation

Qiao Jiang, Guangzhong Xie, Lixia Xiong, Baobin Liao, Longcheng Que, Yun Zhou, and Jian Lv "Research of the effects of TEC on UFPA noise performance", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 841923 (15 October 2012); https://doi.org/10.1117/12.974301

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Microbolometers

Infrared radiation

Temperature metrology

Resistance

Staring arrays

Data acquisition

Nonuniformity corrections

Show All Keywords

Keywords/Phrases

Search In:

Publication Years