Monte Carlo simulation of spatial reflectance pattern of translucent material with subsurface structure

H. J. Juttula; A. J. Mäkynen

doi:10.1117/12.2019130

3 May 2013 Monte Carlo simulation of spatial reflectance pattern of translucent material with subsurface structure

H. J. Juttula, A. J. Mäkynen

Proceedings Volume 8774, Optical Sensors 2013; 87741R (2013) https://doi.org/10.1117/12.2019130
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

Translucent materials allow light to travel inside them while exposed to scattering or absorption events. Wood is an example of translucent material with long cylindrical cells forming an anisotropic internal structure. The most characteristic scattering phenomenon of laser light associated with wood surface is the elongation of spatial reflectance pattern in the direction of wood cells which is called the tracheid effect. We used Monte Carlo simulations of light to reproduce this effect with a model of translucent material with internal cylinder network and used the simulated backscattering patterns to predict macroscopic physical properties of the model. The cylinders represented the tracheid cells of softwood and they were filled with either air or water to produce a macroscopic moisture content of the simulated material. Different densities of material were modeled by varying the diameters of the cylinders. The effects of different moisture contents, densities and surface profiles to spatially resolved reflectance of light were observed by analyzing the shape of the simulated backscattering patterns. Partial least squares (PLS) models were created to predict moisture and density of models with unknown properties. Moisture was found to increase transmission and distance that light travels inside the material and also turning the orientation of the highest contour level by 90 degrees with respect to that of a dry sample while the size of the scattering pattern was found out to decrease as density increased. Density and moisture errors of PLS model predictions were 0.018 g/mm³ and 10.97 % with R2=0.921 and R2=0.925, respectively.

Citation Download Citation

H. J. Juttula and A. J. Mäkynen "Monte Carlo simulation of spatial reflectance pattern of translucent material with subsurface structure", Proc. SPIE 8774, Optical Sensors 2013, 87741R (3 May 2013); https://doi.org/10.1117/12.2019130

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