A NIR scene simulation method based on reflection properties of target

Huilei Yang; Yan Ding; Zhemin Zhang

doi:10.1117/12.2012448

13 March 2013 A NIR scene simulation method based on reflection properties of target

Huilei Yang, Yan Ding, Zhemin Zhang

Proceedings Volume 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing; 87830A (2013) https://doi.org/10.1117/12.2012448
Event: Fifth International Conference on Machine Vision (ICMV 12), 2012, Wuhan, China

Abstract

In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.

Citation Download Citation

Huilei Yang, Yan Ding, and Zhemin Zhang "A NIR scene simulation method based on reflection properties of target", Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87830A (13 March 2013); https://doi.org/10.1117/12.2012448

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