Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker

O. Hofherr; C. Wachten; C. Müller; H. Reinecke

doi:10.1117/12.2020499

13 May 2013 Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker

O. Hofherr, C. Wachten, C. Müller, H. Reinecke

Author Affiliations +

Proceedings Volume 8788, Optical Measurement Systems for Industrial Inspection VIII; 87881I (2013) https://doi.org/10.1117/12.2020499
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

High precision optical non-contact position measurement is a key technology in modern engineering. Laser trackers (LT) can determine accurately x-y-z coordinates of passive retroreflectors. Next-generation systems answer the additional need to measure an object‘s rotational orientation (pitch, yaw, roll). These devices are based either on photogrammetry or on enhanced retroreflectors. However, photogrammetry relies on costly camera systems and time-consuming image processing. Enhanced retroreflectors analyze the LT‘s beam but are restricted in roll angle measurements. In the past we have presented a new method [1][2] to measure all six degrees of freedom in conjunction with a LT. Now we dramatically optimized the method and designed a new prototype, e.g. taking into consideration optical alignment, reduced power loss, highly optimized measuring signals and higher resolution. A method is described that allows compensating the influence of the LT’s beam offset during tracking the active retroreflector. We prove the functionality of the active retroreflector with the LT and, furthermore, demonstrate the capability of the system to characterize the tracking behavior of a LT. The measurement range for the incident laser beam is ±12° with a resolution of 0.6".

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O. Hofherr, C. Wachten, C. Müller, and H. Reinecke "Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker", Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881I (13 May 2013); https://doi.org/10.1117/12.2020499

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