Paper
12 March 2014 Phase mask optimization for 3D parallax EDF microscopy
Ingeborg E. Beckers, Michael Gierlack, Robert Höppel, Jürgen Landskron
Author Affiliations +
Abstract
Extended depth-of-field (EDF) microscopy is a well-investigated and very simple method to obtain projection images with an extended depth of focus. Despite its advantages of being a real-time method applicable to any microscopic mode with high lateral resolution that can be simply realized by extending a commercial microscope, the lack of z-correlation is still a problem. In this work we present a combined technique of EDF and stereomicroscopy. By cross-correlation depth information is obtained. Finally, 3D images are reconstructed for best phase masks and simulation results are evaluated experimentally.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ingeborg E. Beckers, Michael Gierlack, Robert Höppel, and Jürgen Landskron "Phase mask optimization for 3D parallax EDF microscopy", Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89490Z (12 March 2014); https://doi.org/10.1117/12.2036144
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KEYWORDS
Microscopy

Microscopes

Point spread functions

3D image processing

Focus stacking

Cameras

Signal to noise ratio

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