Determination Of Fields Near A Silver Strip On A Glass Substrate

Egon Marx; E.Clayton Teague

doi:10.1117/12.944541

12 July 1988 Determination Of Fields Near A Silver Strip On A Glass Substrate

Egon Marx, E.Clayton Teague

Author Affiliations +

Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988) https://doi.org/10.1117/12.944541
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

The theory and numerical considerations that are used in the computation of the scattered electromagnetic fields near the surface of a silver strip on a glass substrate are presented. These calculations provide theoretical guidance for the measurement of the width of the strip by means of near-field optical scanning. The dimensions of the strip cross section, e. g. 300 nm by 100 nm, can be a fraction of the wavelength of the incident light, 632.8 nm. The flux 1 nm above the surface shows sharp spikes at the edges of the strip. The features of the fields near such a surface could be used for accurate width measurements up to about 30 nm above the strip. The effects of other variables are also shown in the figures.

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Egon Marx and E.Clayton Teague "Determination Of Fields Near A Silver Strip On A Glass Substrate", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); https://doi.org/10.1117/12.944541

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