Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments

D. W. Pohl; U. Ch. Fischer; U. T. Durig

doi:10.1117/12.944518

12 July 1988 Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments

D. W. Pohl, U. Ch. Fischer, U. T. Durig

Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988) https://doi.org/10.1117/12.944518
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

The elastic scattering efficiency from subwavelength-size surface holes or protrusions depends sensitively on the dielectric properties of their immediate environment. Scanning near-field optical microscopy exploits this effect to create optical images whose resolution is not restricted by the diffraction limit. Typically, 20 nm laterally and, when operated in a topographic mode, 0.1 nm in height can be resolved. Images were obtained both in transmission and reflection.

Citation Download Citation

D. W. Pohl, U. Ch. Fischer, and U. T. Durig "Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); https://doi.org/10.1117/12.944518

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