Phase measuring deflectometry for thin actuated mirrors

Tom Catling; David Brooks; Peter Doel

doi:10.1117/12.2056996

18 July 2014 Phase measuring deflectometry for thin actuated mirrors

Tom Catling, David Brooks, Peter Doel

Proceedings Volume 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation; 91510S (2014) https://doi.org/10.1117/12.2056996
Event: SPIE Astronomical Telescopes + Instrumentation, 2014, Montréal, Quebec, Canada

Abstract

In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.

Citation Download Citation

Tom Catling, David Brooks, and Peter Doel "Phase measuring deflectometry for thin actuated mirrors", Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); https://doi.org/10.1117/12.2056996

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