Measurement System For Emissivity Independent Temperature Measuring On Targets With Low Emissivity

Ortwin W. Strub

doi:10.1117/12.968502

1 January 1988 Measurement System For Emissivity Independent Temperature Measuring On Targets With Low Emissivity

Ortwin W. Strub

Author Affiliations +

Proceedings Volume 0934, Thermosense X: Thermal Infrared Sensing for Diagnostics and Control; (1988) https://doi.org/10.1117/12.968502
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

Temperature measuring on targets with low emissivity is difficult to take in the range of 0,1 - 0,2 by conventional methods and measuring equipment. In the temperature range below 200°C this type of measuring can not be carried out at all. Due to the low emissivity, the measuring result is to a large extend distorted by the ambient radiation reflected on the target. In addition to this, the emissivity is not exactly known in most cases and can change in the course of measuring. The innovative measurement system cited above is an answer to these difficulties. It is operated by 2 pyrometers of the same wavelength. Ambient conditions are defined for both pyrometers and measured as well. All signals are fed into a computer-aided interpretation system and are subsequently interconnected. The actual emissivity as well as the target temperature can be retrieved from this data.

Citation Download Citation

Ortwin W. Strub "Measurement System For Emissivity Independent Temperature Measuring On Targets With Low Emissivity", Proc. SPIE 0934, Thermosense X: Thermal Infrared Sensing for Diagnostics and Control, (1 January 1988); https://doi.org/10.1117/12.968502

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