Eddy current imaging for electrical characterization of silicon solar cells and TCO layers

Byungguk Hwang; Susanne Hillmann; Martin Schulze; Marcus Klein; Henning Heuer

doi:10.1117/12.2085302

27 March 2015 Eddy current imaging for electrical characterization of silicon solar cells and TCO layers

Byungguk Hwang, Susanne Hillmann, Martin Schulze, Marcus Klein, Henning Heuer

Author Affiliations +

Proceedings Volume 9439, Smart Materials and Nondestructive Evaluation for Energy Systems 2015; 94390D (2015) https://doi.org/10.1117/12.2085302
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2015, San Diego, California, United States

Abstract

Eddy Current Testing has been mainly used to determine defects of conductive materials and wall thicknesses in heavy industries such as construction or aerospace. Recently, high frequency Eddy Current imaging technology was developed. This enables the acquirement of information of different depth level in conductive thin-film structures by realizing proper standard penetration depth. In this paper, we summarize the state of the art applications focusing on PV industry and extend the analysis implementing achievements by applying spatially resolved Eddy Current Testing. The specific state of frequency and complex phase angle rotation demonstrates diverse defects from front to back side of silicon solar cells and characterizes homogeneity of sheet resistance in Transparent Conductive Oxide (TCO) layers. In order to verify technical feasibility, measurement results from the Multi Parameter Eddy Current Scanner, MPECS are compared to the results from Electroluminescence.

Citation Download Citation

Byungguk Hwang, Susanne Hillmann, Martin Schulze, Marcus Klein, and Henning Heuer "Eddy current imaging for electrical characterization of silicon solar cells and TCO layers", Proc. SPIE 9439, Smart Materials and Nondestructive Evaluation for Energy Systems 2015, 94390D (27 March 2015); https://doi.org/10.1117/12.2085302

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