Paper
1 June 2015 Impedance spectroscopy for detection of mold in archives with an integrated reference measurement
P. Papireddy Vinayaka, S. Van Den Driesche, S. Janssen, M. Frodl, R. Blank, F. Cipriani, W. Lang, M.J. Vellekoop
Author Affiliations +
Proceedings Volume 9518, Bio-MEMS and Medical Microdevices II; 95180T (2015) https://doi.org/10.1117/12.2178510
Event: SPIE Microtechnologies, 2015, Barcelona, Spain
Abstract
In this work, we present a new miniaturized culture medium based sensor system where we apply an optical reference in an impedance measurement approach for the detection of mold in archives. The designed sensor comprises a chamber with pre-loaded culture medium which promotes the growth of archive mold species. Growth of mold is detected by measuring changes in the impedance of the culture medium caused due to increase in the pH (from 5.5 to 8) with integrated electrodes. Integration of the reference measurement helps in determining the sensitivity of the sensor. The colorimetric principle serves as a reference measurement that indicates a pH change after which further pH shifts can be determined using impedance measurement. In this context, some of the major archive mold species Eurotium amstelodami, Aspergillus penicillioides and Aspergillus restrictus have been successfully analyzed on-chip. Growth of Eurotium amstelodami shows a proportional impedance change of 10 % (12 chips tested) per day, with a sensitivity of 0.6 kΩ/pH unit.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Papireddy Vinayaka, S. Van Den Driesche, S. Janssen, M. Frodl, R. Blank, F. Cipriani, W. Lang, and M.J. Vellekoop "Impedance spectroscopy for detection of mold in archives with an integrated reference measurement", Proc. SPIE 9518, Bio-MEMS and Medical Microdevices II, 95180T (1 June 2015); https://doi.org/10.1117/12.2178510
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Electrodes

Contamination

Dielectric spectroscopy

Glasses

Optical inspection

Semiconducting wafers

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