Wavelength dependence of refractive index in scintillation (Lu0.9Y0.1)2SiO5 single crystal

Huiling Hu; Chongjun He

doi:10.1117/12.2185408

14 July 2015 Wavelength dependence of refractive index in scintillation (Lu_0.9Y_0.1)₂SiO₅ single crystal

Huiling Hu, Chongjun He

Proceedings Volume 9532, Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers; 95320W (2015) https://doi.org/10.1117/12.2185408
Event: Pacific Rim Laser Damage, 2015, Jiading, Shanghai, China

Abstract

The refractive indices of anisotropic (Lu_0.9Y_0.1)₂SiO₅ (LYSO) single crystal at different wavelengths have been measured by the minimum deviation method at room temperature. Its refractive indices decrease quickly with the increasing wavelength. Sellmeier dispersion equations were obtained by means of least square fitting, which can predict the refractive indices in transparent region. The dispersion behavior was also described by single-oscillator approximation with physical significance.

Citation Download Citation

Huiling Hu and Chongjun He "Wavelength dependence of refractive index in scintillation (Lu_0.9Y_0.1)₂SiO₅ single crystal", Proc. SPIE 9532, Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers, 95320W (14 July 2015); https://doi.org/10.1117/12.2185408

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