Study on high resolution and high repeatability target localization algorithm in development of national level standard

Yao Huang; Weichen Wang; Zi Xue

doi:10.1117/12.2203028

8 October 2015 Study on high resolution and high repeatability target localization algorithm in development of national level standard

Yao Huang, Weichen Wang, Zi Xue

Author Affiliations +

Proceedings Volume 9675, AOPC 2015: Image Processing and Analysis; 967534 (2015) https://doi.org/10.1117/12.2203028
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

At the National Institute of Metrology, China, the national level standard was established for calibrating the level measuring instruments widely used in the field of surveying, construction and engineering. As a key technology in the development, an auto collimation system was set up to compare the level under test with the water level. In the auto collimation system, a charge-coupled device (CCD) camera was set up to acquired the image of a light spot reflected from the water surface and the plane mirror, a composite image processing and analyzing algorithm was designed to find the exact position of the light spot in the image. This target localization algorithm consists of sub-algorithm of background de-noising, dimension transforming, and curve fitting. The experiments prove that this algorithm get resolution of 0.002″, and repeatability of 0.01″.

Citation Download Citation

Yao Huang, Weichen Wang, and Zi Xue "Study on high resolution and high repeatability target localization algorithm in development of national level standard", Proc. SPIE 9675, AOPC 2015: Image Processing and Analysis, 967534 (8 October 2015); https://doi.org/10.1117/12.2203028

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