Third-generation solar cells, such as organic and perovskite solar cells are all relying on a semiconducting thin-film active layer to harvest the solar energy. The bulk morphology of the active layer in terms of crystal structure, orientation, grain size and nanophase separation behaviors is known to be critical to the solar cell device performance. Here, we will present our recent studies on the process-structure-device correlation of organic and perovskite solar cells. In these studies, state-of-art grazing incidence scattering techniques using X-rays and neutrons were employed for various purposes, such as wide-angle/small-angle X-ray/Neutron scattering (GIWAXS/GISAXS/GISANS) and transmission small-angle X-ray scattering (GTSAXS).
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