Near-field imaging of optical resonance modes in silicon metasurfaces using photoelectron microscopy

Alex Boehm; Sylvain D. Gennaro; Chloe F. Doiron; Thomas E. Beechem; Michael B. Sinclair; Igal Brener; Raktim Sarma; Taisuke Ohta

doi:10.1117/12.2676035

4 October 2023 Near-field imaging of optical resonance modes in silicon metasurfaces using photoelectron microscopy

Alex Boehm, Sylvain D. Gennaro, Chloe F. Doiron, Thomas E. Beechem, Michael B. Sinclair, Igal Brener, Raktim Sarma, Taisuke Ohta

Author Affiliations +

Proceedings Volume PC12646, Metamaterials, Metadevices, and Metasystems 2023; PC1264616 (2023) https://doi.org/10.1117/12.2676035
Event: SPIE Nanoscience + Engineering, 2023, San Diego, California, United States

Abstract

Experimental examination of light-matter interactions at the nanoscale is challenging since the corresponding electromagnetic near-field is often confined within volumes below the resolution of conventional optical microscopy. Here, we demonstrate that photoemission electron microscopy (PEEM) can image near-field optical fields in nanophotonic structures. We present concurrent spectroscopy and imaging of the near-field distribution of resonance modes supported by broken-symmetry silicon metasurfaces. Additionally, we can examine collective modes and deduce that coupling between eight resonators establishes the collective excitations. Altogether, the high-spatial resolution of this hyperspectral imaging approach is valuable for the metrology of collective, non-local optical resonances in nanophotonic systems.

Conference Presentation

Citation Download Citation

Alex Boehm, Sylvain D. Gennaro, Chloe F. Doiron, Thomas E. Beechem, Michael B. Sinclair, Igal Brener, Raktim Sarma, and Taisuke Ohta "Near-field imaging of optical resonance modes in silicon metasurfaces using photoelectron microscopy", Proc. SPIE PC12646, Metamaterials, Metadevices, and Metasystems 2023, PC1264616 (4 October 2023); https://doi.org/10.1117/12.2676035

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