Presentation
6 October 2023 Non-destructive identification through thick materials using a terahertz parametric generator and detector
Author Affiliations +
Abstract
The injection-seeded terahertz wave parametric generator (is-TPG) technology presented here is expected to enable measurements through thick shielding due to its wide dynamic range of over 120 dB in combination with detection methods that up-convert the terahertz wave to a near-infrared beam. Furthermore, recently machine learning has been applied to the fingerprint spectral analysis of reagents, which has enhanced identification accuracy. Real-time measurement has also been achieved by multi-wavelength generation and detection with image recognition of detection Stokes beams. We will present these improvements in is-TPG technology for non-destructive testing.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kosuke Murate, Sota Mine, and Kodo Kawase "Non-destructive identification through thick materials using a terahertz parametric generator and detector", Proc. SPIE PC12683, Terahertz Emitters, Receivers, and Applications XIV, PC126830C (6 October 2023); https://doi.org/10.1117/12.2681710
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KEYWORDS
Nondestructive evaluation

Terahertz radiation

Imaging systems

Crystals

Iris recognition

Machine learning

Terahertz technology

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