Presentation
24 November 2023 Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime
Matthew S. Dabney, Brian Arnold, Cyrus Rashvand
Author Affiliations +
Abstract
There has been a concern with the typical Laser-Induced Damage Threshold (LIDT) testing due to the small allowable spot size and the small required tested area. With the current tests, it is possible to actually miss defects entirely, resulting in a higher LIDT value. Experiments conducted in this study compare traditional LIDT measurements in the nanosecond regime made with a broad variant in spot sizes. These same spot sizes are also used to run larger area scans to evaluate the damage sites per area. Experimental results will be presented and discussed in the broader scope of developing a reliable LIDT standard.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matthew S. Dabney, Brian Arnold, and Cyrus Rashvand "Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime", Proc. SPIE PC12726, Laser-Induced Damage in Optical Materials 2023, PC1272607 (24 November 2023); https://doi.org/10.1117/12.2685272
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KEYWORDS
Laser damage threshold

Beam diameter

Optical scanning systems

Laser development

Laser induced damage

Lasers

Mirrors

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