Meghan N. Beattie,1 Michael Schachtner,2 Karin Hinzer,1 David Lackner,2 Oliver Höhn,2 Gerald Siefer,2 Henning Helmershttps://orcid.org/0000-0003-1660-76512
1Univ. of Ottawa (Canada) 2Fraunhofer-Institut für Solare Energiesysteme ISE (Germany)
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The standard method to measure subcell external quantum efficiency (EQE) for multi-junction photovoltaics (MJPV) uses light biasing to bring each subcell into current limitation. This method is suitable when each subcell absorbs in a different wavelength range. However, isolating individual subcells via light biasing is difficult for semitransparent subcells with overlapping absorptance, as in MJPV designed for monochromatic irradiance in power-by-light systems. For these cells, the standard measurement approach falls short. Here, we present an alternative technique that incorporates a negative bias voltage to overcome this limitation. We demonstrate subcell EQE measurements in MJPV devices with up to six GaAs subcells.
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Meghan N. Beattie, Michael Schachtner, Karin Hinzer, David Lackner, Oliver Höhn, Gerald Siefer, Henning Helmers, "EQE measurement technique for multi-junction photovoltaics with overlapping subcell absorptance," Proc. SPIE PC12881, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XIII, PC1288107 (9 March 2024); https://doi.org/10.1117/12.3001662