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12 March 2024 Single-pixel diffractive terahertz sensor enables rapid detection of hidden defects and structures
Jingxi Li, Xurong Li, Nezih T. Yardimci, Jingtian Hu, Yuhang Li, Junjie Chen, Yi-Chun Hung, Mona Jarrahi, Aydogan Ozcan
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Proceedings Volume PC12885, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII; PC128850Q (2024) https://doi.org/10.1117/12.3000659
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
We present a diffractive terahertz sensor using a single-pixel detector to rapidly sense hidden defects within a target sample volume. Leveraging multiple spatially-engineered diffractive layers optimized via deep learning, this diffractive sensor can all-optically process the sample scattered waves and generate an output spectrum encoding information for indicating the presence/absence of hidden defects. We experimentally validated this framework using a single-pixel terahertz time-domain spectroscopy set-up and 3D-printed diffractive layers, successfully detecting unknown hidden defects within silicon samples. By circumventing raster scanning and digital image formation/reconstruction, this framework holds vast potential for various applications requiring high-throughput, non-destructive defect detection.
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Jingxi Li, Xurong Li, Nezih T. Yardimci, Jingtian Hu, Yuhang Li, Junjie Chen, Yi-Chun Hung, Mona Jarrahi, and Aydogan Ozcan "Single-pixel diffractive terahertz sensor enables rapid detection of hidden defects and structures", Proc. SPIE PC12885, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII, PC128850Q (12 March 2024); https://doi.org/10.1117/12.3000659
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KEYWORDS
Defect detection
Millimeter wave sensors
Terahertz radiation
Sensors
Spectroscopy
Terahertz spectroscopy
Statistical modeling
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