Advanced microcomb designs for integrated metrology systems

Kerry J. Vahala

doi:10.1117/12.3011692

13 March 2024 Advanced microcomb designs for integrated metrology systems

Kerry J. Vahala

Proceedings Volume PC12912, Quantum Sensing, Imaging, and Precision Metrology II; PC129122A (2024) https://doi.org/10.1117/12.3011692
Event: SPIE Quantum West, 2024, San Francisco, California, United States

Abstract

This conference presentation was prepared for SPIE Photonics West, 2024.

Conference Presentation

Citation Download Citation

Kerry J. Vahala "Advanced microcomb designs for integrated metrology systems", Proc. SPIE PC12912, Quantum Sensing, Imaging, and Precision Metrology II, PC129122A (13 March 2024); https://doi.org/10.1117/12.3011692

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