ESA’s all-in-one bench for visible and IR detector characterisation

Thibaut Prod'homme; Sander Blommaert; James Etchells; Ivo Visser; Dennis Breeveld

doi:10.1117/12.3018144

28 August 2024 ESA’s all-in-one bench for visible and IR detector characterisation

Thibaut Prod'homme, Sander Blommaert, James Etchells, Ivo Visser, Dennis Breeveld

Author Affiliations +

Proceedings Volume PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI; PC131030R (2024) https://doi.org/10.1117/12.3018144
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Conference Poster

Abstract

ESA’s Science Payload Validation laboratory is developing a new type of detector characterisation bench, designed to cope with new challenges set by future instrument requirements and newly developed detectors. This new bench can accommodate large format detector up to 4kx4k 10um pitch or at least two 2kx2k 15um pitch side by side, it enables measurement in the 300 to 4000nm wavelength range, and can bring the detector temperature down to 20K. Its concept, based on lessons learned accumulated over the last 10 years, enables light and dark measurements to be performed in a single configuration reducing handling and optimising testing time in test campaigns. This contribution provides a general overview of the bench concept and main features. It details the main design challenges and describes the corresponding opto-mechanical and thermal design solutions, validated by early commissioning results.

Citation Download Citation

Thibaut Prod'homme, Sander Blommaert, James Etchells, Ivo Visser, and Dennis Breeveld "ESA’s all-in-one bench for visible and IR detector characterisation", Proc. SPIE PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, PC131030R (28 August 2024); https://doi.org/10.1117/12.3018144

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