Presentation
2 October 2024 Advanced computational metrologies: measuring the shape of ultrashort pulses of light
Author Affiliations +
Abstract
Ultrafast pulse-beams are four-dimensional, space–time phenomena that can exhibit complicated spatiotemporal coupling. Tailoring the spatiotemporal profile of an ultrafast pulse beam is necessary for a variety of applications ranging from basic science involving high-intensity light matter interactions to applied microscopy and advanced manufacturing and micromachining.

In this talk I will discuss the development of a novel single-pulse, reference-free spatiotemporal characterization technique based on two colocated synchronized measurements: (1) broadband single-shot ptychography and (2) single-shot frequency resolved optical gating. We apply the technique to measure the nonlinear propagation of an ultrafast pulse beam through a fused silica window. Our spatiotemporal characterization method represents a major contribution to the growing field of spatiotemporally engineered ultrafast laser pulse beams.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel E. Adams, Jonathan Barolak, David Goldberger, Bojana Ivanic, and Charles Durfee "Advanced computational metrologies: measuring the shape of ultrashort pulses of light ", Proc. SPIE PC13130, Novel Optical Systems, Methods, and Applications XXVII, PC1313006 (2 October 2024); https://doi.org/10.1117/12.3028773
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KEYWORDS
Nonlinear dynamics

Optical coherence

Microscopy

Ultrafast imaging

Metrology

Computational imaging

Multiplexing

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