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18 December 2024 Electron dynamics of femtosecond laser induced plasma inside multilayer dielectric high reflectors studied using particle-in-cell (PIC) approach
Ziyao Su, Joseph Smith, Enam Chowdhury
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Proceedings Volume PC13190, Laser-Induced Damage in Optical Materials 2024; PC1319006 (2024) https://doi.org/10.1117/12.3033000
Event: SPIE Laser Damage, 2024, San Ramon, CA, United States
Abstract
The ultrahigh-intensity laser systems are crucial to various applications such as particle acceleration and research of extreme conditions. Therefore, a higher laser induced damage threshold (LIDT) of optical components is demanded. To study the mechanisms of the ultrafast laser-solid interaction, the modeling is important. Traditional modeling of ultrashort laser-solid interaction is based on Finite-Difference-Time-Domain (FDTD) that can only reveal the electromagnetic field distributions. However, Particle-in-Cell (PIC) simulation can reveal both the field distributions and the particle dynamics. We used and modified EPOCH with Keldysh photoionization and a model for a spatially varying permittivity to capture the thermalization of the electrons and the plasma generation in a multi-layer dielectric mirror irradiated by a few-cycle pulse and predict the LIDT. The modeling work can provide guidance on designing and manufacturing of the optical components.
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Ziyao Su, Joseph Smith, and Enam Chowdhury "Electron dynamics of femtosecond laser induced plasma inside multilayer dielectric high reflectors studied using particle-in-cell (PIC) approach", Proc. SPIE PC13190, Laser-Induced Damage in Optical Materials 2024, PC1319006 (18 December 2024); https://doi.org/10.1117/12.3033000
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KEYWORDS
Photonic integrated circuits
Plasma
Dielectrics
Femtosecond phenomena
Laser damage threshold
Reflectors
Simulations
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