Scanning near-field optical microscopy with a tetrahedral tip at a resolution of 6 nm

J. Koglin; Uwe Fischer; Harald Fuchs

doi:10.1117/12.227700

1 January 1996 Scanning near-field optical microscopy with a tetrahedral tip at a resolution of 6 nm

J. Koglin, Uwe Fischer, Harald Fuchs

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Journal of Biomedical Optics, Vol. 1, Issue 1, (January 1996). https://doi.org/10.1117/12.227700

Abstract

Using a tetrahedral tip as a probe, it is possible to combine the techniques of scanning tunneling microscopy (STM) and scanning near-field optical microscopy (SNOM) in the same probe tip so that the probing of the respective near-field interactions occurs virtually at the same spot of the tip. Atomic resolution on pyrolytic graphite and stable images on rough samples are routinely obtained in the STM mode. In the combined SNOM/STM mode, an absorption contrast in the optical image is obtained with images of evaporated silver films on glass as well as of silver deposited on an indium tin oxide substrate. We obtained a point-to-point resolution of 6 nm, whereas the edge resolution is about 1 nm.

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J. Koglin, Uwe Fischer, and Harald Fuchs "Scanning near-field optical microscopy with a tetrahedral tip at a resolution of 6 nm," Journal of Biomedical Optics 1(1), (1 January 1996). https://doi.org/10.1117/12.227700

Published: 1 January 1996

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