Heterojunction internal photoemission Si0.7Ge0.3/Si infrared detector

True Lon Lin; Jin Suk Park; Sarath D. Gunapala; Eric W. Jones; Hector M. Del Castillo

doi:10.1117/12.163403

1 March 1994 Heterojunction internal photoemission Si_0.7Ge_0.3/Si infrared detector

True Lon Lin, Jin Suk Park, Sarath D. Gunapala, Eric W. Jones, Hector M. Del Castillo

Author Affiliations +

Optical Engineering, Vol. 33, Issue 3, (March 1994). https://doi.org/10.1117/12.163403

Abstract

Single-layer and multilayer Si_0.7Ge_0.3/Si heterojunction internal photoemission (HIP) detectors with cutoff wavelengths out to ~23 μm have been demonstrated. Near-ideal thermionic emission dark current characteristics and photoresponse at wavelengths up to 20 μm were measured. The cutoff wavelength λ_c and emission coefficient C₁ of the HIP detectors were determined by the modified Fowler plot at the wavelength regime where the corresponding photon energies were smaller than the Fermi energy (~0.15 eV) of the degenerate Si_0.7Ge_0.3 layers. Similar optical and thermal potential barriers were obtained. The use of multiple Si_0.7Ge_0.3/Si layers in the stacked HIP detector structure resulted in a significantly increased emission coefficient C₁ compared to the single-layer HIP detectors due to an enhanced internal photoemission efficiency without the loss of IR absorption.

Citation Download Citation

True Lon Lin, Jin Suk Park, Sarath D. Gunapala, Eric W. Jones, and Hector M. Del Castillo "Heterojunction internal photoemission Si_0.7Ge_0.3/Si infrared detector," Optical Engineering 33(3), (1 March 1994). https://doi.org/10.1117/12.163403

Published: 1 March 1994

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