Fourier transform profilometry using a binary area modulation technique

William Lohry; Song Zhang

doi:10.1117/1.OE.51.11.113602

2 November 2012 Fourier transform profilometry using a binary area modulation technique

William Lohry, Song Zhang

Author Affiliations +

Funded by: National Science Foundation

Optical Engineering, Vol. 51, Issue 11, 113602 (November 2012). https://doi.org/10.1117/1.OE.51.11.113602

Abstract

A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.

Citation Download Citation

William Lohry and Song Zhang "Fourier transform profilometry using a binary area modulation technique," Optical Engineering 51(11), 113602 (2 November 2012). https://doi.org/10.1117/1.OE.51.11.113602

Published: 2 November 2012

ACCESS THE FULL ARTICLE

JOURNAL ARTICLE
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY