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4 December 2012 Negative refraction via radiative surface phonon polaritons in a silicon carbide-based multilayer structure
Olalekan S. Adewuyi, James S. Hammonds
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Optical Engineering, Vol. 51, Issue 12, 120502 (December 2012). https://doi.org/10.1117/1.OE.51.12.120502
Abstract
In this letter, we predict that radiative surface phonon polariton (RSPhP) modes, in a multilayer structure consisting of thin-film silicon carbide (SiC) bounded by silicon (Si) and diamond (Di), can be used to achieve negative refraction of mid-infrared light at approximately 11 μm. Dispersion relations, calculated for the Si/SiC/Di structure, show that the RSPhP mode exhibits negative dispersion and couples with incident light. Poynting vector calculations show how the energy flux may be refracted, negatively, in the SiC layer.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
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Olalekan S. Adewuyi and James S. Hammonds "Negative refraction via radiative surface phonon polaritons in a silicon carbide-based multilayer structure," Optical Engineering 51(12), 120502 (4 December 2012). https://doi.org/10.1117/1.OE.51.12.120502
Published: 4 December 2012
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KEYWORDS
Silicon carbide
Polaritons
Phonons
Negative refraction
Silicon
Diamond
Interfaces
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