Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

Denis  V. Sutyrin; Nicola Poli; Nicolò Beverini; Guglielmo M. Tino

doi:10.1117/1.OE.53.12.122603

14 July 2014 Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

Denis V. Sutyrin, Nicola Poli, Nicolò Beverini, Guglielmo M. Tino

Author Affiliations +

Optical Engineering, Vol. 53, Issue 12, 122603 (July 2014). https://doi.org/10.1117/1.OE.53.12.122603

Abstract

We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (f_CEO) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the f_CEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the f_CEO phase noise and stability than the pump laser type.

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Denis V. Sutyrin, Nicola Poli, Nicolò Beverini, and Guglielmo M. Tino "Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs," Optical Engineering 53(12), 122603 (14 July 2014). https://doi.org/10.1117/1.OE.53.12.122603

Published: 14 July 2014

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