Maximized reliability with minimal cross-layer cutset under arbitrary link failure probability in multilayer optical networks

Yongli Zhao; Bowen Chen; Jie Zhang

doi:10.1117/1.OE.55.9.096110

23 September 2016 Maximized reliability with minimal cross-layer cutset under arbitrary link failure probability in multilayer optical networks

Yongli Zhao, Bowen Chen, Jie Zhang

Author Affiliations +

Funded by: National Natural Science Foundation of China (NSFC), Natural Science Foundation of China, NSFC Project, State Key Laboratory of Advanced Optical Communication Systems Networks China

Optical Engineering, Vol. 55, Issue 9, 096110 (September 2016). https://doi.org/10.1117/1.OE.55.9.096110

Abstract

We investigate the maximized cross-layer reliability under arbitrary link failure probability in multilayer optical networks. A concept of minimal cross-layer cutset is first defined and a reliability model with arbitrary physical link failure probability is built in the multilayer optical networks. In order to reduce the scale of cutset enumeration, we introduce two metrics to estimate cross-layer reliability, i.e., the minimum cross-layer node reliability and the minimum cross-layer edge reliability (MCER). Furthermore, we develop two linear programming (LP) models and two heuristic algorithms to maximize the cross-layer reliability of multilayer optical networks, i.e., the minimum shared-risk mapping algorithm and the least shared failure probability algorithm. Simulation results show that: (i) the cross-layer reliability of the two proposed algorithms is close to the LP solutions under logical networks with different sizes, which achieves better results in terms of additional resources utilization compared with the shortest path algorithm; (ii) less difference between the results of our proposed algorithms and the results of the shortest path algorithm is accompanied by a small standard deviation of failure probability distribution. Moreover, the superiority of our proposed algorithms becomes more remarkable with the increasing of the standard deviation.

Citation Download Citation

Yongli Zhao, Bowen Chen, and Jie Zhang "Maximized reliability with minimal cross-layer cutset under arbitrary link failure probability in multilayer optical networks," Optical Engineering 55(9), 096110 (23 September 2016). https://doi.org/10.1117/1.OE.55.9.096110

Published: 23 September 2016

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