26 March 2021 Optimum GeSbSe layer design with respect to transmission and thickness
Nicoleta Nedelcu, Veturia Chiroiu, Ligia Munteanu
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Abstract

Compared to the rapid development of design methods, the optimization of the GeSbSe layer design is still lagging behind. Accordingly, the layer design should be acceptable for existing methods. Optimum selection of GeSbSe layer design in connection to transmission and thickness choice is discussed. The GexSb40  −  xSe60 (x  =  12, 25, and 30 at.%) were synthesized from elements with 5N purity (Ge, Sb, and Se) using the conventional melt-quenching method. The experimental measurements are obtained in spectral range 250 to 1700 nm using spectrophotometer UV-VIS Lambda correlated with theoretical simulation obtained by OpenFilters. OpenFilters allows the creation of a material with higher transmission and low thickness for the possible applications in infrared transmitting filters and three-level phase-change memory.

© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2021/$28.00 © 2021 SPIE
Nicoleta Nedelcu, Veturia Chiroiu, and Ligia Munteanu "Optimum GeSbSe layer design with respect to transmission and thickness," Optical Engineering 60(3), 035109 (26 March 2021). https://doi.org/10.1117/1.OE.60.3.035109
Received: 8 December 2020; Accepted: 9 March 2021; Published: 26 March 2021
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KEYWORDS
Selenium

Antimony

Chalcogenides

Germanium

Refractive index

Optical properties

Optical engineering

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