Transient Temperature Technique For Measuring Normal Spectral And Normal Total Emittance

Robert J. Tiernan; James E. Saunders

doi:10.1117/12.960782

11 September 1989 Transient Temperature Technique For Measuring Normal Spectral And Normal Total Emittance

Robert J. Tiernan, James E. Saunders

Proceedings Volume 1112, Window and Dome Technologies and Materials; (1989) https://doi.org/10.1117/12.960782
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

Normal spectral and normal total emittance values were obtained for sapphire and translucent alumina using Fourier-transform infrared spectroscopy. Values were derived from radiance measurements in the spectral range of 5000 cm-1 to 400 cm-1, and in the temperature range of 900 K to 1450 K. Samples were dropped from a furnace into the nitrogen ambient of the spectrometer to the position where the internal globar source is normally focused. Temperatures were determined from radiance values at 1027 cm-1 where alumina has zero reflectivity and transmittance. Standard deviations of the total normal emittances, expressed as percentages of the average of three drops, were ≤3% of the averages.

Citation Download Citation

Robert J. Tiernan and James E. Saunders "Transient Temperature Technique For Measuring Normal Spectral And Normal Total Emittance", Proc. SPIE 1112, Window and Dome Technologies and Materials, (11 September 1989); https://doi.org/10.1117/12.960782

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