Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)

Jérôme Ferrand; Guillaume Custillon; Gregory Leblond; Fabrice Thomas; Thibault Moulin; Etienne le Coarer; Alain Morand; Sylvain Blaize; Thierry Gonthiez; Pierre Benech

doi:10.1117/12.841349

11 February 2010 Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)

Jérôme Ferrand, Guillaume Custillon, Gregory Leblond, Fabrice Thomas, Thibault Moulin, Etienne le Coarer, Alain Morand, Sylvain Blaize, Thierry Gonthiez, Pierre Benech

Author Affiliations +

Proceedings Volume 7604, Integrated Optics: Devices, Materials, and Technologies XIV; 760414 (2010) https://doi.org/10.1117/12.841349
Event: SPIE OPTO, 2010, San Francisco, California, United States

Abstract

The size and the weight of current spectrometers is a serious issue regarding various applications, however the technologies used in existing spectrometers prevent them from substantial improvement. SWIFTS (Stationary Wave Integrated Fourier Transform Spectrometer) is a new familyof spectrometers based on a verypromising technology. It is based on an original wayto fully sample the Fourier interferogram obtained in a waveguide byeither a reflection (SWIFTS Lippmann) or counter-propagative (SWIFTS Gabor) interference phenomenon. The sampling can be simultaneouslydone without anymo ving part thanks to "nano-detectors" located in the evanescent field of the waveguide. It allows a dramatic reduction of the size and the weight of spectrometers while improving their performances (high stabilityand high resolution δσ < 1cm^-1). Here, we present the development status of the SWIFTS Gabor and the results obtained (resolution of 4cm^-1) with existing technical solutions for the "nano-detectors" in visible and near infrared.

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Jérôme Ferrand, Guillaume Custillon, Gregory Leblond, Fabrice Thomas, Thibault Moulin, Etienne le Coarer, Alain Morand, Sylvain Blaize, Thierry Gonthiez, and Pierre Benech "Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)", Proc. SPIE 7604, Integrated Optics: Devices, Materials, and Technologies XIV, 760414 (11 February 2010); https://doi.org/10.1117/12.841349

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