Impact of thermal treatment on electrical characteristics and charge collection efficiency of Me-GaAs:Cr-Me x-ray sensors

V. Novikov; A. Zarubin; O. Tolbanov; A. Tyazhev; A. Lozinskaya; D. Budnitsky; M. Skakunov

doi:10.1117/12.2187181

26 August 2015 Impact of thermal treatment on electrical characteristics and charge collection efficiency of Me-GaAs:Cr-Me x-ray sensors

V. Novikov, A. Zarubin, O. Tolbanov, A. Tyazhev, A. Lozinskaya, D. Budnitsky, M. Skakunov

Author Affiliations +

Proceedings Volume 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII; 95930F (2015) https://doi.org/10.1117/12.2187181
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

In this article the results of experimental investigations of resistivity, charge collection efficiency, mobility lifetime μ _n·τ_n product and I-V curves dependencies on thermal treatment of Me-GaAs:Cr-Me X-ray sensors are presented. Experimental samples were the pad sensors with active area 0.1-0.25 cm2 and active layer thickness of 400-500 μm. The μ _n·τ_n product was estimated using charge collection efficiency dependency on bias measured with the use of gammarays of ²⁴¹Am source.

It was shown that thermal treatment in the temperature range of 200-500°C doesn’t lead to a sufficient degradation of sensor’s characteristics and can be used in array detectors processing.

Citation Download Citation

V. Novikov, A. Zarubin, O. Tolbanov, A. Tyazhev, A. Lozinskaya, D. Budnitsky, and M. Skakunov "Impact of thermal treatment on electrical characteristics and charge collection efficiency of Me-GaAs:Cr-Me x-ray sensors", Proc. SPIE 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII, 95930F (26 August 2015); https://doi.org/10.1117/12.2187181

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