Paper
27 August 2010 Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation
F. Frassetto, S. Coraggia, L. Poletto, N. Guerassimova, S. Dziarzhytski, E. Ploenjes, H. Weigelt
Author Affiliations +
Abstract
We present the design and characterization of the spectrometer to be used at the FLASH facility (DESY, Hamburg) to characterize the spectral properties of free-electron-laser radiation in terms of high harmonics content. The spectrometer is sensitive in the 2-40 nm region. The optical design consists of two spherical gratings with variable groove spacing and a extreme-ultraviolet-enhanced CCD detector. The instrument design and characterization are presented.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Frassetto, S. Coraggia, L. Poletto, N. Guerassimova, S. Dziarzhytski, E. Ploenjes, and H. Weigelt "Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 780209 (27 August 2010); https://doi.org/10.1117/12.861615
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectroscopy

Sensors

Free electron lasers

Extreme ultraviolet

Charge-coupled devices

CCD image sensors

Optical design

RELATED CONTENT

FEL-based transient grating spectroscopy
Proceedings of SPIE (May 12 2015)
Design of spherical varied line space gratings for a high...
Proceedings of SPIE (October 01 1991)
Design and modeling of a low f number wide field...
Proceedings of SPIE (November 13 1996)
Wide-range CCD spectrometer
Proceedings of SPIE (August 23 1996)
SDO EVE CCD and thin foil filter characterization and selection
Proceedings of SPIE (September 20 2007)

Back to Top