Phase diagrams and in-plane anisotropic misfit strains of (110) Ba0.6Sr0.4TiO3 thin films grown on (001) orthorhombic NdGaO3 substrate

P. F. Liu; X. J. Meng; J. L. Sun; J. H. Ma; J. H. Chu

doi:10.1117/12.792157

11 March 2008 Phase diagrams and in-plane anisotropic misfit strains of (110) Ba_0.6Sr_0.4TiO₃ thin films grown on (001) orthorhombic NdGaO₃ substrate

P. F. Liu, X. J. Meng, J. L. Sun, J. H. Ma, J. H. Chu

Author Affiliations +

Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 698405 (2008) https://doi.org/10.1117/12.792157
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China

Abstract

Using Landau-Devonshire(LD)-type phenomenological model, we investigate the phase diagrams and in-plane anisotropic misfit strains of single-domain single-crystal (110) Ba_0.6Sr_0.4TiO₃ film epitaxially deposited on (001) NdGaO₃ substrate. Investigation indicates that film thickness plays a crucial role on formation of in-plane anisotropic misfit strains and stable phases. As is consistent with results of experiment that anisotropic strains have greatly changes with increase of film thickness. The anisotropic strains induce tetragonal phases which only contain in-plane spontaneous polarization component. These phases do not exist in BST films of the same composition under isotropic strains. Moreover, calculation manifests that anisotropic in-plane misfit strains are almost completely relaxed when film thickness is larger than 600nm, which has been reported in experiment.

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P. F. Liu, X. J. Meng, J. L. Sun, J. H. Ma, and J. H. Chu "Phase diagrams and in-plane anisotropic misfit strains of (110) Ba_0.6Sr_0.4TiO₃ thin films grown on (001) orthorhombic NdGaO₃ substrate", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698405 (11 March 2008); https://doi.org/10.1117/12.792157

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