Publisher’s Note: This paper, originally published on 13 March 2015, was replaced with a corrected/revised version on 6 August 2019. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance.
This paper presents an image-based method to measure reflectance of a homogeneous flexible object material (usually used in packaging). A point light source and a commercially available RGB camera is used to illuminate and measure the radiance reflected from the object surface in multiple reflection directions. By curving the flexible object onto a cylinder of known radius we are able to record radiance at multiple reflection angles in a faster way. In order to estimate the reflectance and to characterise the material, a spectralon reference tile is used. The spectralon tile is assumed to be homogenous and has near lambertain surface properties. Using Lambert’s cosine law, irradiance at a given point on the object surface is calculated. This information is then used to calculate a BRDF using Phong reflection model to describe the sample surface reflection properties. The measurement setup is described and discussed in this paper along with its use to estimate a BRDF for a given material/substrate. Results obtained indicate that the proposed image-based technique works well to measure light reflected at different planar angles and record information to estimate the BRDF of the sample materials that can be modelled using Phong reflection model. The object material properties, sample curvature and camera resolution decides the number of incident and reflection angles at which the bi-directional reflectance, or the material BRDF, can be estimated using this method.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.