Mr. Andrew Ames Profile

Andrew Ames

at Harvard-Smithsonian Ctr for Astrophysics

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Author

Publications (4)

Proceedings Article | 29 August 2017 Paper

Characterization of multilayer coated replicated Wolter optics for imaging x-ray emission from pulsed power

A. Ames, D. Ampleford, C. Bourdon, R. Bruni, K. Kilaru, B. Kozioziemski, M. Pivovaroff, B. Ramsey, S. Romaine, J. Vogel, C. Walton, M. Wu

Proceedings Volume 10399, 103991X (2017) https://doi.org/10.1117/12.2275721

KEYWORDS: Multilayers, X-ray optics, Optical coatings, Laser optics, X-ray characterization, X-rays, Pulsed power, Prototyping, Optical fabrication, X-ray imaging

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Proceedings Article | 27 October 2016 Paper

Toward large-area sub-arcsecond x-ray telescopes II

Stephen O'Dell, Ryan Allured, Andrew Ames, Michael Biskach, David Broadway, Ricardo Bruni, David Burrows, Jian Cao, Brandon Chalifoux, Kai-Wing Chan, Yip-Wah Chung, Vincenzo Cotroneo, Ronald Elsner, Jessica Gaskin, Mikhail Gubarev, Ralf Heilmann, Edward Hertz, Thomas Jackson, Kiranmayee Kilaru, Jeffrey Kolodziejczak, Ryan McClelland, Brian Ramsey, Paul Reid, Raul Riveros, Jacqueline Roche, Suzanne Romaine, Timo Saha, Mark Schattenburg, Daniel Schwartz, Eric Schwartz, Peter Solly, Susan Trolier-McKinstry, Melville Ulmer, Alexey Vikhlinin, Margeaux Wallace, Xiaoli Wang, David Windt, Youwei Yao, Shi Ye, William Zhang, Heng Zuo

Proceedings Volume 9965, 996507 (2016) https://doi.org/10.1117/12.2238247

KEYWORDS: X-ray telescopes, Mirrors, Coating, X-ray optics, Silicon, Ion implantation, X-rays, Thin films, Ions, Iridium

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Proceedings Article | 23 September 2015 Paper

Using iridium films to compensate for piezo-electric materials processing stresses in adjustable x-ray optics

A. Ames, R. Bruni, V. Cotroneo, R. Johnson-Wilke, T. Kester, P. Reid, S. Romaine, S. Tolier-McKinstry, R. H. T. Wilke

Proceedings Volume 9603, 96031I (2015) https://doi.org/10.1117/12.2191404

KEYWORDS: Glasses, Mirrors, Ferroelectric materials, X-ray optics, Iridium, X-rays, Coating, Silicon, Semiconducting wafers, Electrodes

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Proceedings Article | 12 May 2015 Paper

Achieving zero stress in iridium, chromium, and nickel thin films

David Broadway, Jeffrey Weimer, Danielle Gurgew, Tomasz Lis, Brian Ramsey, Stephen O'Dell, Mikhail Gubarev, A. Ames, R. Bruni

Proceedings Volume 9510, 95100E (2015) https://doi.org/10.1117/12.2180641

KEYWORDS: Iridium, Argon, Chromium, Surface roughness, Nickel, X-rays, Sensors, Thin films, Temperature metrology, Spherical lenses

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