Dr. Anne Fornier
at CEA
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 23 July 1999 Paper
Daniel Schirmann, Luc Bianchi, Roger Courchinoux, Anne Fornier, Henry Jaquet, Francois Jequier, Alain Geille, Jean Gomme, Thierry Lonjaret
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354185
KEYWORDS: X-rays, Fusion energy, Contamination, Ions, Boron, X-ray optics, Gold, Aluminum, Silica, Environmental sensing

Proceedings Article | 23 July 1999 Paper
Francois Genin, Alexander Rubenchik, Alan Burnham, Michael Feit, J. Yoshiyama, Anne Fornier, C. Cordillot, Daniel Schirmann
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354235
KEYWORDS: Silica, Contamination, Metals, Copper, Absorption, Thin films, Gold, Aluminum, Laser damage threshold, Laser induced damage

Proceedings Article | 23 July 1999 Paper
Anne Fornier, D. Bernardino, Odile Lam, Jerome Neauport, Francois Dufour, Bernard Schmitt, Jean-Marie Mackowski
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354213
KEYWORDS: Mirrors, Manufacturing, Laser damage threshold, Laser scattering, Scattering, Absorption, Sputter deposition, Ion beams, Contamination, Scatter measurement

Proceedings Article | 7 April 1999 Paper
Anne Fornier, Philippe Feru, B. Pinot, Herve Leplan, G. Leroux, Scott Burkhart, Timothy Weiland
Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344454
KEYWORDS: Mirrors, Optical components, Laser damage threshold, Laser optics, Coating, Polarizers, Laser welding, Optical testing, Hybrid fiber optics

Proceedings Article | 7 April 1999 Paper
Christelle Dubern, J.-L. Bruneel, Patrick Chadeyron, C. Cordillot, M. Couzi, Anne Fornier, Pierre Joubert, Daniel Schirmann
Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344379
KEYWORDS: Particles, Boron, Carbon, Photography, Laser induced damage, Reflectivity, Silica, Vitreous, Scanning electron microscopy, Laser damage threshold

Proceedings Article | 20 April 1998 Paper
Anne Fornier, C. Cordillot, D. Bernardino, B. Pinot, Bernard Geenen, Herve Leplan, W. Alexandre
Proceedings Volume 3244, (1998) https://doi.org/10.1117/12.307002
KEYWORDS: Laser damage threshold, Laser components, Laser welding, Laser induced damage, Gaussian beams, Nd:YAG lasers, Optical testing

Proceedings Article | 20 April 1998 Paper
Anne Fornier, C. Cordillot, D. Schirman, Francois Genin, Alan Burnham, Pamela Whitman, Michael Feit, Alexander Rubenchik, J. Yoshiyama
Proceedings Volume 3244, (1998) https://doi.org/10.1117/12.307038
KEYWORDS: Thin films, Contamination, Silica, Laser induced damage, Laser damage threshold, Sputter deposition, Optical components, Nd:YAG lasers, Optical microscopy, Scanning electron microscopy

Proceedings Article | 8 December 1997 Paper
Odile Lam, Andre Roussel, Anne Fornier, Bernard Geenen, Herve Leplan, B. Pinot, W. Alexandre, P. Pally
Proceedings Volume 3047, (1997) https://doi.org/10.1117/12.294281
KEYWORDS: Mirrors, Coating, Laser damage threshold, Interferometers, Laser induced damage, Liquids, Polarizers, Spatial filters, Electron transport, Absorption

Proceedings Article | 8 December 1997 Paper
Anne Fornier, C. Cordillot, D. Bernardino, O. Lam, Andre Roussel, Claude Amra, Ludovic Escoubas, Gerard Albrand, Mireille Commandre, Pierre Roche
Proceedings Volume 3047, (1997) https://doi.org/10.1117/12.294284
KEYWORDS: Absorption, Scattering, Laser scattering, Laser damage threshold, Multilayers, Laser beam diagnostics, Refractive index, Optical coatings, Pulsed laser operation, Thin films

Proceedings Article | 8 December 1997 Paper
Anne Fornier, C. Cordillot, D. Bernardino, O. Lam, Andre Roussel, B. Pinot, Bernard Geenen, Herve Leplan, W. Alexandre
Proceedings Volume 3047, (1997) https://doi.org/10.1117/12.294292
KEYWORDS: Mirrors, Laser damage threshold, Contamination, Scattering, Particles, Microscopes, Laser induced damage, Atomic force microscopy, Polarization, Shape analysis

Proceedings Article | 13 May 1997 Paper
Anne Fornier, C. Cordillot, D. Bernardino, Odile Lam, Andre Roussel, Claude Amra, Ludovic Escoubas, Gerard Albrand, Mireille Commandre
Proceedings Volume 2966, (1997) https://doi.org/10.1117/12.274239
KEYWORDS: Absorption, Scattering, Laser scattering, Laser damage threshold, Silica, Laser beam diagnostics, Laser irradiation, Optical coatings, Laser induced damage, Light scattering

Proceedings Article | 13 May 1997 Paper
Anne Fornier, C. Cordillot, D. Bernardino, Odile Lam, Andre Roussel, B. Pinot, Bernard Geenen, Herve Leplan, W. Alexandre
Proceedings Volume 2966, (1997) https://doi.org/10.1117/12.274240
KEYWORDS: Mirrors, Laser damage threshold, Absorption, Atomic force microscopy, Scattering, Shape analysis, Ion beams, Laser induced damage, Scatter measurement, Silicon

Proceedings Article | 27 May 1996 Paper
Anne Fornier, C. Cordillot, D. Bernardino, Dominique Ausserre, F. Paris
Proceedings Volume 2714, (1996) https://doi.org/10.1117/12.240386
KEYWORDS: Atomic force microscopy, Laser optics, Optical coatings, Laser energy, Laser damage threshold, Laser induced damage, Statistical analysis, Multilayers, Mirrors

Proceedings Article | 27 May 1996 Paper
Proceedings Volume 2714, (1996) https://doi.org/10.1117/12.240402
KEYWORDS: Sputter deposition, Multilayers, Oxides, Thin film coatings, Optical coatings, Deposition processes, Ion beams, Laser induced damage, Camera shutters, Atomic force microscopy

Proceedings Article | 14 July 1995 Paper
Stephane Seznec, Anne Fornier, C. Cordillot
Proceedings Volume 2428, (1995) https://doi.org/10.1117/12.213714
KEYWORDS: Laser induced damage, Sputter deposition, Mirrors, Optical amplifiers, Pulsed laser operation, Laser damage threshold, Physics, Laser systems engineering, Laser resonators, Resonators

Proceedings Article | 4 November 1994 Paper
Anne Fornier, C. Cordillot, Dominique Ausserre, F. Paris
Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192158
KEYWORDS: Atomic force microscopy, Optical coatings, Laser damage threshold, Laser optics, Multilayers, Mirrors, Dielectrics, Neodymium glass lasers, Reflectivity, Pulsed laser operation

Proceedings Article | 28 July 1994 Paper
Anne Fornier, C. Cordillot, Dominique Ausserre, F. Paris
Proceedings Volume 2114, (1994) https://doi.org/10.1117/12.180922
KEYWORDS: Atomic force microscopy, Optical coatings, Laser damage threshold, Laser optics, Multilayers, Mirrors, Dielectrics, Neodymium glass lasers, Reflectivity, Pulsed laser operation

Showing 5 of 17 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top