Dr. Benoît Sassolas
Research Engineer at IN2P3
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 18 July 2024 Presentation + Paper
E. Sturm, R. Davies, J. Alves, Y. Clénet, J. Kotilainen, A. Monna, H. Nicklas, J.-U. Pott, E. Tolstoy, B. Vulcani, J. Achren, S. Annadevara, H. Anwand-Heerwart, C. Arcidiacono, S. Barboza, L. Barl, P. Baudoz, R. Bender, N. Bezawada, F. Biondi, P. Bizenberger, A. Blin, A. Boné, P. Bonifacio, B. Borgo, J. van den Born, T. Buey, Y. Cao, F. Chapron, G. Chauvin, F. Chemla, K. Cloiseau, M. Cohen, C. Colin, O. Czoske, J.-O. Dette, M. Deysenroth, E. Dijkstra, S. Dreizler, O. Dupuis, G. van Egmond, F. Eisenhauer, E. Elswijk, A. Emslander, M. Fabricius, G. Fasola, F. Ferreira, N. Förster Schreiber, A. Fontana, J. Gaudemard, N. Gautherot, E. Gendron, C. Gennet, R. Genzel, L. Ghouchou, S. Gillessen, D. Gratadour, A. Grazian, F. Grupp, S. Guieu, M. Gullieuszik, M. de Haan, J. Hartke, M. Hartl, F. Haussmann, T. Helin, H.-J. Hess, R. Hofferbert, H. Huber, E. Huby, J.-M. Huet, D. Ives, A. Janssen, P. Jaufmann, T. Jilg, D. Jodlbauer, J. Jost, W. Kausch, H. Kellermann, F. Kerber, H. Kravcar, K. Kravchenko, C. Kulcsár, H. Kuncarayakti, P. Kunst, S. Kwast, F. Lang, J. Lange, V. Lapeyrere, B. Le Ruyet, K. Leschinski, H. Locatelli, D. Massari, S. Mattila, S. Mei, F. Merlin, E. Meyer, C. Michel, L. Mohr, M. Montargès, F. Müller, N. Münch, R. Navarro, U. Neumann, N. Neumayer, L. Neumeier, F. Pedichini, A. Pflüger, R. Piazzesi, L. Pinard, J. Porras, E. Portulari, N. Przybilla, S. Rabien, J. Raffard, R. Ragazzoni, R. Ramlau, J. Ramos, S. Ramsay, H.-F. Raynaud, P. Rhode, A. Richter, H.-W. Rix, M. Rodenhuis, R.-R. Rohloff, R. Romp, P. Rousselot, N. Sabha, B. Sassolas, J. Schlichter, M. Schuil, M. Schweitzer, U. Seemann, A. Sevin, M. Simioni, L. Spallek, A. Sönmez, J. Suuronen, S. Taburet, J. Thomas, E. Tisserand, P. Vaccari, E. Valenti, G. Verdoes Kleijn, M. Verdugo, F. Vidal, R. Wagner, M. Wegner, D. van Winden, J. Witschel, A. Zanella, W. Zeilinger, J. Ziegleder, B. Ziegler
Proceedings Volume 13096, 1309611 (2024) https://doi.org/10.1117/12.3017752
KEYWORDS: Imaging systems, James Webb Space Telescope, Imaging spectroscopy, Design and modelling, Adaptive optics, Stars, Manufacturing, Equipment, Wavefront sensors, Spectroscopes

Proceedings Article | 27 August 2022 Poster + Paper
M. Baron, B. Sassolas, P.-A. Frugier, L. Gaspar Venancio, J. Amiaux, M. Castelnau, F. Keller, G. Dovillaire, P. Treimany, R. Juvénal, L. Miller, L. Pinard, A. Ealet
Proceedings Volume 12180, 121804V (2022) https://doi.org/10.1117/12.2630072
KEYWORDS: Point spread functions, Optical coatings, Mirrors, Phase shifts, Polarization, Wavefronts, Reflectivity, Metrology, Thin films, Wavefront aberrations, Space telescopes, Dichroic splitting

Proceedings Article | 13 December 2020 Poster + Paper
Proceedings Volume 11451, 114515K (2020) https://doi.org/10.1117/12.2563398
KEYWORDS: Optical coatings, Astronomical instrumentation, Optics manufacturing, Astronomy, Astronomical imaging, Optical testing, Lawrencium, Spectrographs

Proceedings Article | 10 July 2018 Paper
B. Sassolas, M. Betoule, N. Regnault, B. Lagrange, D. Hofman, L. Balzarini, L. Pinard, D. Forest, G. Cagnoli, J.-C. Cuillandre, T. Benedict
Proceedings Volume 10706, 107064E (2018) https://doi.org/10.1117/12.2312003
KEYWORDS: Bandpass filters, Optical filters, Humidity, Spectrophotometry, Calibration, Telescopes, Metrology

Proceedings Article | 10 July 2018 Paper
C. Michel, E. Barthelemy, D. Hofman, L. Pinard, B. Sassolas, J. Teillon, G. Cagnoli
Proceedings Volume 10706, 107064Y (2018) https://doi.org/10.1117/12.2312076
KEYWORDS: Optical coatings, Lenses, Antireflective coatings, Optics manufacturing, Spectrographs, Cameras, Reflectivity, Thin film coatings, Silica

Showing 5 of 13 publications
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