Mr. Bernd C. Meyer Profile

Bernd C. Meyer

Specialist Scientific Instrumentation

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 8 October 2024 Presentation + Paper

Metrology of 1.2m-long x-ray mirrors mounted in a bender mechanism for QUATI beamline/SIRIUS

Regis de Oliveira, Gustavo Lima, Willian Wilendorf, Gustavo de Almeida, Humberto Junior, Victor dos Ynamassu, Rafael de Moraes, Giovanni Ribeiro, Ramon Paulino, Henri Guadalupi, Luca Peverini, Bernd Meyer

Proceedings Volume 13150, 1315009 (2024) https://doi.org/10.1117/12.3035467

KEYWORDS: Mirrors, Vibration, Calibration, Metrology, Nanooptomechanical systems, Mirror surfaces, Deformation, X-rays

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Proceedings Article | 4 October 2022 Presentation + Paper

Dimensional and optical metrology of ultra-stable exactly-constrained KB mirror sets

Y. R. Tonin, C. S. N. C. Bueno, I. Z. Lago, J. C. S. Carvalho, F. R. Lena, B. C. Meyer, E. X. S. Miqueles, R. R. Geraldes, G. B. Z. L. Moreno

Proceedings Volume 12240, 122400F (2022) https://doi.org/10.1117/12.2633679

KEYWORDS: Stitching interferometry, X-ray optics, Fizeau interferometers, Synchrotron radiation instrumentation, Synchrotron technology, Mirrors, Calibration, Optical alignment, Metrology, Optical metrology, Tolerancing

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Proceedings Article | 4 October 2022 Presentation + Paper

Diagnostics of KB mirrors misalignment using Zernike rectangular polynomials and neural networks

Sergio A. Luiz, Cassiano S. N. Bueno, Francisco M. Silva, Rafael Celestre, Bernd Meyer, Regis Oliveira, Alessandra Tomal, Helio C. Tolentino, Carlos S. Dias

Proceedings Volume 12240, 1224003 (2022) https://doi.org/10.1117/12.2633614

KEYWORDS: Mirrors, Neural networks, Tolerancing, Diagnostics, Optical alignment, Zernike polynomials, Wavefronts, Monochromatic aberrations, X-ray optics, Optical simulations

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Proceedings Article | 21 August 2020 Presentation + Paper

Flexible optical layouts based on cylindrical mirrors with sagittal curvature for high-stability beamlines

Sergio A. Luiz, Artur Pinto, Humberto Junior, Bernd Meyer, Ana Zeri, Florian Meneau, Antonio Malfatti-Gasperini, Márcio Soares, Guilherme Calligaris, Luciano Candido, Harry Westfahl

Proceedings Volume 11493, 1149305 (2020) https://doi.org/10.1117/12.2568920

KEYWORDS: Optical aberrations, Mirrors, Point spread functions, Synchrotrons, Monochromators, Beam shaping, X-rays, Solids, Crystals, Beam propagation method

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Proceedings Article | 21 August 2020 Presentation + Paper

Surface metrology of cylindrical mirrors with sagittal curvature in low spatial frequency range

Artur Pinto, Bernd Meyer, Sergio A. Luiz, Yuri Tonin, Regis de Oliveira, Flavio Borges, Lucas Volpe, Gabriel Claudiano, Renan Geraldes

Proceedings Volume 11492, 1149209 (2020) https://doi.org/10.1117/12.2568868

KEYWORDS: Mirrors, Metrology, Spatial frequencies, Synchrotrons, Finite element methods, X-rays

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Proceedings Article | 7 September 2017 Presentation + Paper

A new optics metrology laboratory at CNPEM: metrology capabilities, performance, and future plans

Bernd Meyer, Murilo da Silva

Proceedings Volume 10385, 103850C (2017) https://doi.org/10.1117/12.2274020

KEYWORDS: Metrology, Optical metrology, Interferometry, Nano opto mechanical systems, X-ray optics, Calibration, Optical fabrication, Signal attenuation, Temperature metrology

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Proceedings Article | 23 August 2017 Presentation + Paper

Simulation and optimization of the SIRIUS IPE soft x-ray beamline

Bernd Meyer, Tulio C. Rocha, Sergio A. Luiz, Artur C. Pinto, Harry Westfahl

Proceedings Volume 10388, 103880D (2017) https://doi.org/10.1117/12.2273971

KEYWORDS: Optical simulations, X-rays, Wavefronts, Wave propagation, Optical components, Thermal effects, Beam propagation method, Device simulation, Spectroscopy

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Proceedings Article | 23 September 2011 Paper

A toolkit for the X-ray optics simulation software package XOP/ShadowVui

Bernd Meyer

Proceedings Volume 8141, 814114 (2011) https://doi.org/10.1117/12.893745

KEYWORDS: Mirrors, Optical components, Optical simulations, Synchrotrons, X-ray optics, Monochromators, Finite element methods, Crystals, Error analysis, Optical filters

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Showing 5 of 8 publications

Conference Committee Involvement (10)

Advances in Metrology for X-Ray and EUV Optics XI

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Sources, Optics, and Components XX

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics X

23 August 2023 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVIII

22 August 2023 | San Diego, California, United States

Showing 5 of 10 Conference Committees

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