This paper shows an integrated coherent receiver (ICR) based on silicon photonics, with a packaging size of 26.2 mm*12 mm*4.35 mm. The DC signals are controlled by 34 straight pins, while the RF signals are transmitted via a flexible printed circuit (FPC). The ICR is defined by the OIF Implementation Agreement for Integrated Dual Polarization Micro-Intradyne Coherent Receivers1 . After packaging, the optoelectronic 3dB bandwidth exceeds 70 GHz and the receiver achieves a minimal BER of 2e-5, and sensitivity surpassing -28 dBm at 1567.13nm when operating under 400G PM-QPSK (Quadrature Phase Shift Keying).
We build three different schemes for 800G ICR (integrated coherent receiver) S21 testing. By analyzing the accuracy, repeatability, efficiency, dynamic range etc., we can get their advantages and disadvantages, which will guide our choice for proper 800G ICR testing.
We present an improved 400G chip/device level Integrated Coherent Receiver (ICR) optical-electronic testing system based on the system last year [1]. It shows high repeatability and high accuracy compared with commercial system. This new system can greatly promote the efficiency, and it is also compatible for 100G/400G chip level test and device level test. What’s more, the system can get most of important parameters of ICR automatically.
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