We report on an expanded catalog1–4 of various common (and uncommon) black and white materials used in the construction and/or baffling of optical systems and as screen material for calibration systems. Total reflectance is measured over a broad wavelength range (250 nm < λ < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Reflectivity data for the complete sample inventory will be available via Filtergraph, an online data visualization tool.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.