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Cheolkyu Kim
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Publications (1)
Proceedings Article | 10 April 2024 Poster + Paper
Using deep learning ADC for defect classification for automatic defect inspection
Proceedings Volume 12955, 129551X (2024) https://doi.org/10.1117/12.3000815
KEYWORDS: Analog to digital converters, Deep learning, Machine learning, Education and training, Image classification, Evolutionary algorithms, Performance modeling, Matrices, Library classification systems, Image processing
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