Dr. Craig R. Forest Profile

Dr. Craig R. Forest

Associate Professor at Georgia Institute of Technology

SPIE Involvement:

Author

Publications (7)

SPIE Journal Paper | 20 July 2017 Open Access

Genetically expressed voltage sensor ArcLight for imaging large scale cortical activity in the anesthetized and awake mouse (erratum)

Peter Borden, Alex Ortiz, Christian Waiblinger, Audrey Sederberg, Arthur Morrissette, Craig Forest, Dieter Jaeger, Garrett Stanley

NPh, Vol. 4, Issue 03, 039801, (July 2017) https://doi.org/10.1117/12.10.1117/1.NPh.4.3.039801

KEYWORDS: Image sensors, Sensors, Optical sensors, Light emitting diodes, Biomedical engineering, Neuroscience, Biology, Mechanical engineering, Error analysis, Neurophotonics

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Proceedings Article | 14 May 2007 Paper

Microforging technique for rapid low-cost fabrication of lens array molds

C. Forest, M. Saez, I. Hunter

Proceedings Volume 10316, 1031614 (2007) https://doi.org/10.1117/12.717838

KEYWORDS: Fabrication, Optical spheres, Diamond turning, Aluminum, Manufacturing, Array processing, Polishing, Spherical lenses, Radium, Telecommunications

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Proceedings Article | 11 October 2004 Paper

Thin-foil reflection gratings for Constellation-X

Ralf Heilmann, Mireille Akilian, Chih-Hao Chang, Craig Forest, Chulmin Joo, Andrew Lapsa, Juan Montoya, Mark Schattenburg

Proceedings Volume 5488, (2004) https://doi.org/10.1117/12.552001

KEYWORDS: Nanoimprint lithography, Reflection, Metrology, Diffraction gratings, Wafer-level optics, Thermography, Silicon, Wavefront sensors, Semiconducting wafers, Distortion

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SPIE Journal Paper | 1 March 2004

Metrology of thin transparent optics using Shack-Hartmann wavefront sensing

Craig Forest, Claude Canizares, Daniel Neal, Michael McGuirk, Mark Schattenburg

OE, Vol. 43, Issue 03, (March 2004) https://doi.org/10.1117/12.10.1117/1.1645256

KEYWORDS: Wavefront sensors, Sensors, Metrology, Wavefronts, Reflection, Lamps, Charge-coupled devices, Optical filters, Glasses, Optical engineering

Proceedings Article | 29 January 2004 Paper

Advances in reflection grating technology for Constellation-X

Ralf Heilmann, Mireille Akilian, Chih-Hao Chang, Carl Chen, Craig Forest, Chulmin Joo, Paul Konkola, Juan Montoya, Yanxia Sun, Jenny You, Mark Schattenburg

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.510258

KEYWORDS: Semiconducting wafers, Silicon, Etching, Diffraction gratings, Assembly tolerances, Optical fabrication, Optical lithography, Metrology, Nanoimprint lithography, Roentgenium

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Proceedings Article | 11 March 2003 Paper

Precision shaping, assembly, and metrology of foil optics for x-ray reflection gratings

Craig Forest, Mark Schattenburg, Carl Chen, Ralf Heilmann, Paul Konkola, JoHanna Przbylowski, Yanxia Sun, Jenny You, Steven Kahn, Donald Golini

Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461477

KEYWORDS: Metrology, Assembly tolerances, Wavefront sensors, Surface finishing, X-rays, Silicon, Reflection, Polishing, Semiconducting wafers, Sensors

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Proceedings Article | 11 March 2003 Paper

Constellation-X spectroscopy x-ray telescope (SXT)

Robert Petre, William Zhang, David Content, Timo Saha, Jeff Stewart, Jason Hair, Diep Nguyen, William Podgorski, William Davis, Mark Freeman, Lester Cohen, Mark Schattenburg, Ralf Heilmann, Yanxia Sun, Craig Forest

Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461317

KEYWORDS: Reflectors, Mirrors, Epoxies, Glasses, X-ray telescopes, X-rays, Spatial resolution, X-ray optics, Optical alignment, Prototyping

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Showing 5 of 7 publications

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