Dr. Daehwa Jeong Profile

Dr. Daehwa Jeong

SPIE Involvement:

Author

Proceedings Article | 17 November 2008 Paper

A fast and high resolution x-ray imaging sensor for tape substrate inspection

Jung-Yeol Yeom, Young-Jun Roh, Chang-Ook Jung, Dae-Hwa Jeong

Proceedings Volume 7266, 72660Q (2008) https://doi.org/10.1117/12.807340

KEYWORDS: X-rays, Sensors, Microchannel plates, X-ray imaging, Inspection, Spatial resolution, Image sensors, Defect detection, Particles, Microscopes

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Proceedings Article | 19 October 2006 Paper

A boundary tracking approach for tape substrate pattern inspection based on skeleton information

Young Jun Roh, Seung Shin Ho, Cheol Woo Kim, Hyo Hyung Lee, Dae Hwa Jeong

Proceedings Volume 6375, 63750P (2006) https://doi.org/10.1117/12.686444

KEYWORDS: Inspection, Image processing, Defect detection, Distortion, Image registration, Feature extraction, Data modeling, Binary data, Etching, Algorithm development

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Proceedings Article | 6 December 2005 Paper

Defect classification for the inspection of TFT LCD glass

DaeCheol Lim, Dae-Gyu Seo, DaeHwa Jeong

Proceedings Volume 6051, 60510F (2005) https://doi.org/10.1117/12.639878

KEYWORDS: Inspection, Glasses, Particles, Photomasks, Algorithm development, Detection and tracking algorithms, Opto mechatronics, LCDs, Image processing, Defect inspection

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Proceedings Article | 25 October 2004 Paper

Novel all-fiber optic temperature sensors based on hollow optical fibers

Sangsoo Choi, Yongmin Jung, Tae-Jung Eom, Byeong Ha Lee, Kyunghwan Oh, Hyohyung Lee, DaeHwa Jeong

Proceedings Volume 5602, (2004) https://doi.org/10.1117/12.571152

KEYWORDS: Temperature sensors, Cladding, Fiber optics sensors, Fabry–Perot interferometers, Single mode fibers, Sensors, Optical fibers, Temperature metrology, Fiber optics, Control systems

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Proceedings Article | 25 October 2004 Paper

Planar laser light scattering technique for measurement of nonspherical particles

Hyun Woo Kim, Man Soo Choi, Dae Hwa Jeong, Hyo Hyung Lee

Proceedings Volume 5602, (2004) https://doi.org/10.1117/12.571193

KEYWORDS: Particles, Light scattering, Scattering, Fractal analysis, Laser scattering, Scatter measurement, Silica, Transmission electron microscopy, Calibration, Rayleigh scattering

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Proceedings Article | 18 October 2002 Paper

Study on an inspection method of repeated pattern: automatic pattern inspection for TFT LCD

DaeCheol Lim, Seung-Yong Yun, Daehwa Jeong, Cheol-Kee Hong

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467613

KEYWORDS: Inspection, LCDs, Digital imaging, Glasses, Image processing, Image enhancement, Digital image processing, Transistors, Imaging systems, Charge-coupled devices

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