Daniel Decruppe
at CEA-LETI
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 June 2004 Paper
Philippe Bouchut, Laurence Delrive, Daniel Decruppe, Pierre Garrec
Proceedings Volume 5273, (2004) https://doi.org/10.1117/12.521861
KEYWORDS: Silica, Gas lasers, Etching, Laser induced damage, Carbon monoxide, Radiometry, Cartography, Laser damage threshold, Process control, Diagnostics

Proceedings Article | 26 February 2004 Paper
Philippe Bouchut, Laurence Delrive, Daniel Decruppe, Pierre Garrec
Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.512910
KEYWORDS: Silica, Gas lasers, Carbon monoxide, Laser induced damage, Etching, Radiometry, Optical components, Carbon dioxide lasers, Surface finishing, Diagnostics

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