Drew D. Schiltz
Lead Applications Engineer at ZEISS Industrial Quality Solutions
SPIE Involvement:
Author | Science Fair Judge
Publications (2)

Proceedings Article | 2 December 2014 Paper
Proceedings Volume 9237, 92371G (2014) https://doi.org/10.1117/12.2068244
KEYWORDS: Coating, Silica, Laser induced damage, Multilayers, Absorption, Resistance, Laser damage threshold, Reflectors, Mirrors, Interfaces

Proceedings Article | 19 November 2013 Paper
D. Patel, D. Schiltz, P. Langton, L. Emmert, L. Acquaroli, C. Baumgarten, B. Reagan, J. Rocca, W. Rudolph, A. Markosyan, R. Route, M. Fejer, C. Menoni
Proceedings Volume 8885, 888522 (2013) https://doi.org/10.1117/12.2030380
KEYWORDS: Laser induced damage, Reflectors, Silica, Scattering, Multilayers, Picosecond phenomena, Absorption, Surface roughness, Ion beams, Sputter deposition

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