Dr. Eduardo Margallo-Balbás Profile

Dr. Eduardo Margallo-Balbás

CEO at Ommatidia LIDAR S.L.

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Author

Publications (9)

Proceedings Article | 27 April 2016 Paper

Fabrication process of Si microlenses for OCT systems

A. Jovic, G. Pandraud, K. Zinoviev, J. Rubio, E. Margallo, P. Sarro

Proceedings Volume 9888, 98880C (2016) https://doi.org/10.1117/12.2227898

KEYWORDS: Microlens, Silicon, Photoresist materials, Optical coherence tomography, Etching, Plasma etching, Image quality, Semiconducting wafers, Tomography, Infrared imaging, Photoresist processing, Surface roughness, Oxides, Dry etching, Thermal oxidation

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SPIE Journal Paper | 22 November 2012

Sensing performance of plasma-enhanced chemical vapor deposition SiC-SiO2-SiC horizontal slot waveguides

Gregory Pandraud, Eduardo Margallo-Balbas, Pasqualina Sarro

JNP, Vol. 6, Issue 01, 063530, (November 2012) https://doi.org/10.1117/12.10.1117/1.JNP.6.063530

KEYWORDS: Waveguides, Silicon carbide, Refractive index, Plasma enhanced chemical vapor deposition, Biological and chemical sensing, Silicon, Sensors, Oxides, Wave propagation, Interfaces

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Proceedings Article | 1 May 2012 Paper

A comparison between PECVD and ALD for the fabrication of slot-waveguide-based sensors

Grégory Pandraud, Agung Purniawan, Eduardo Margallo-Balbás, Pasqualina Sarro

Proceedings Volume 8424, 84242P (2012) https://doi.org/10.1117/12.922400

KEYWORDS: Waveguides, Silicon carbide, Plasma enhanced chemical vapor deposition, Atomic layer deposition, Sensors, Refractive index, Absorption, Silicon, Silica, Titanium dioxide

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Proceedings Article | 15 May 2010 Paper

Demonstration of PECVD SiC thermal delay lines for optical coherence tomography in the visible

Grégory Pandraud, Eduardo Margallo-Balbás, Pasqualina Sarro

Proceedings Volume 7715, 771509 (2010) https://doi.org/10.1117/12.853686

KEYWORDS: Silicon carbide, Waveguides, Optical coherence tomography, Plasma enhanced chemical vapor deposition, Birefringence, Dispersion, Refractive index, Cladding, Silica, Semiconducting wafers

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Proceedings Article | 28 February 2008 Paper

Miniature optical coherence tomography system based on silicon photonics

Eduardo Margallo-Balbás, Gregory Pandraud, Patrick French

Proceedings Volume 6847, 68470S (2008) https://doi.org/10.1117/12.766797

KEYWORDS: Silicon, Optical coherence tomography, Waveguides, Platinum, Temperature metrology, Oxides, Silicon photonics, Semiconducting wafers, Resistance, Photonic integrated circuits

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Proceedings Article | 7 February 2008 Paper

Telemetric light delivery and monitoring system for photodynamic therapy based on solid-state optodes

Eduardo Margallo-Balbás, Johan Kaptein, Henricus J. C. Sterenborg, Grégory Pandraud, Patrick French, Dominic Robinson

Proceedings Volume 6852, 68520O (2008) https://doi.org/10.1117/12.763951

KEYWORDS: Photodynamic therapy, Electronics, Light emitting diodes, Photodiodes, Solid state electronics, Tissues, Silicon, Sensors, Diodes, Data communications

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Proceedings Article | 10 October 2007 Paper

Thermo-optical delay line for optical coherence tomography

Eduardo Margallo-Balbás, Gregory Pandraud, Patrick French

Proceedings Volume 6717, 671704 (2007) https://doi.org/10.1117/12.754324

KEYWORDS: Waveguides, Optical coherence tomography, Silicon, Finite element methods, Refractive index, Tissues, Modulation, Thermography, Medicine, Planar waveguides

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Proceedings Article | 2 March 2006 Paper

Light transport in trabecular bone: Monte Carlo simulation based on 3D triangle meshes

Eduardo Margallo-Balbás, Patrick French, Peter Wieringa

Proceedings Volume 6142, 61421K (2006) https://doi.org/10.1117/12.652237

KEYWORDS: Bone, Monte Carlo methods, Scattering, Tissue optics, Tissues, Light scattering, Optical properties, Optical coherence tomography, Anisotropy, Computer simulations

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Proceedings Article | 22 September 2005 Paper

Pentacene organic thin film transistors with anodized gate dielectric

Silke Goettling, Jochen Brill, Norbert Fruehauf, Jens Pflaum, Eduardo Margallo-Balbás

Proceedings Volume 5940, 594010 (2005) https://doi.org/10.1117/12.613636

KEYWORDS: Dielectrics, Aluminum, Glasses, Tantalum, Transistors, Thin films, Metals, Silicon, Oxides, Oxidation

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Showing 5 of 9 publications

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